Title :
A metal interface amplifier device
Author :
Spratt, P. ; Witt, William
Author_Institution :
Philco Corporation
Keywords :
Chemicals; Current measurement; Current-voltage characteristics; Doping; Electrons; Equations; Frequency; Gallium arsenide; Heterojunctions; Laboratories; Pulse measurements; Semiconductor diodes; Semiconductor materials; Temperature; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.15059
