Title :
A study of disk noise statistics
Author :
Howell, T.D. ; Kasiraj, P. ; Best, J.S. ; Chu, F. ; Yerry, M.M.
Author_Institution :
IBM Almaden Research Center, San Jose, California
fDate :
9/1/1986 12:00:00 AM
Abstract :
A special-purpose instrument was used to measure peak amplitude distributions in a rigid disk system employing thin-film heads and particulate disks. The distributions are attributed to Gaussian noise together with multiplicative defects whose sizes are exponentially distributed. The observed dependence of these distributions on track width is in reasonable agreement with this hypothesis. Information on the relative importance of various noise sources is also derived from these measurements.
Keywords :
Magnetic disk recording; Magnetic noise; Counting circuits; Error analysis; Gaussian noise; Instruments; Noise measurement; Signal generators; Statistical distributions; Statistics; Transistors; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1986.1064610