DocumentCode
1019576
Title
Capacitance and barrier potential of near-degenerate semiconductor junctions
Author
Chang, Y.F.
Author_Institution
Purdue University, Lafayette, Ind.
Volume
9
Issue
6
fYear
1962
Firstpage
511
Lastpage
511
Keywords
Breakdown voltage; Capacitance measurement; Cryogenics; Electric breakdown; Electrons; Gaussian approximation; Gold; Impact ionization; Impurities; Instruments; Ionization; Laboratories; Space charge; Spontaneous emission; Temperature; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1962.15065
Filename
1473293
Link To Document