DocumentCode :
1019663
Title :
A New Short-Bar Method for 4TP Admittance Standards Calibration by Using a Modified Z-Matrix Expression to Improve Signal-to-Noise Ratio (S/N) for Higher Impedances
Author :
Suzuki, Kiyoshi
Author_Institution :
Meas. Stand. Center, Agilent Technol. Int. Japan, Ltd., Tokyo
Volume :
58
Issue :
4
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
980
Lastpage :
984
Abstract :
This paper describes how to calibrate four-terminal-pair (4TP) admittance standards using a new short-bar method with a modified Z-matrix expression containing a coefficient C 1 . The short-bar method is an effective way of measuring of a signal to the standard with better signal-to-noise ratio (S/N) for higher impedance standards, particularly 1 pF. This allows a 1-pF capacitor to be calibrated using direct measurement at frequencies reported for calibrations. As this method does not require the equivalent circuit for interpolation using measurements at frequencies beyond the reported frequencies, it can be applied to 4TP admittance calibration, where the 4TP sections have the same mechanical structure as lower impedance standards.
Keywords :
calibration; capacitance measurement; electric impedance measurement; interpolation; matrix algebra; capacitance measurement; four-terminal-pair admittance standards calibration; measurement standard; modified Z-matrix expression; signal-to-noise ratio; Capacitance measurement; Z-matrix; four-terminal pair (4TP); impedance measurement; measurement standard; signal detection; signal resolution;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2008.2006958
Filename :
4696016
Link To Document :
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