Title :
A New Short-Bar Method for 4TP Admittance Standards Calibration by Using a Modified Z-Matrix Expression to Improve Signal-to-Noise Ratio
for Higher Impedances
Author_Institution :
Meas. Stand. Center, Agilent Technol. Int. Japan, Ltd., Tokyo
fDate :
4/1/2009 12:00:00 AM
Abstract :
This paper describes how to calibrate four-terminal-pair (4TP) admittance standards using a new short-bar method with a modified Z-matrix expression containing a coefficient C 1 . The short-bar method is an effective way of measuring of a signal to the standard with better signal-to-noise ratio (S/N) for higher impedance standards, particularly 1 pF. This allows a 1-pF capacitor to be calibrated using direct measurement at frequencies reported for calibrations. As this method does not require the equivalent circuit for interpolation using measurements at frequencies beyond the reported frequencies, it can be applied to 4TP admittance calibration, where the 4TP sections have the same mechanical structure as lower impedance standards.
Keywords :
calibration; capacitance measurement; electric impedance measurement; interpolation; matrix algebra; capacitance measurement; four-terminal-pair admittance standards calibration; measurement standard; modified Z-matrix expression; signal-to-noise ratio; Capacitance measurement; Z-matrix; four-terminal pair (4TP); impedance measurement; measurement standard; signal detection; signal resolution;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2008.2006958