Title :
Comment: Intrinsic lineshape and FM response of modulated semiconductor lasers
Author_Institution :
Electrotechnical Laboratory, Optoelectronics Section, Tsukuba, Japan
Keywords :
laser variables measurement; light interferometry; optical modulation; semiconductor junction lasers; spectral line breadth; FM response; fringe visibility; interferometer; intrinsic lineshape; optical modulation; semiconductor lasers; sidebands; stochastic phase fluctuations; visibility function;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860062
