• DocumentCode
    1019987
  • Title

    Comments, with reply, on "Correlation of Arrhenius parameters: the electrotechnical aging compensation effect

  • Author

    Montanari, Gian

  • Author_Institution
    Inst. d´Electrotech. Ind., Bologna Univ., Italy
  • Volume
    23
  • Issue
    6
  • fYear
    1988
  • Firstpage
    1057
  • Lastpage
    1063
  • Abstract
    The commenter makes three particular comments concerning the work of P.K. David (see ibid., vol. 22, p.229-236, 1987). They relate to: (1) the question of whether different properties should be related to aging process in different ways, so that degradation of one property is not as sensitive to aging reactions as for another property; (2) the problem of the common point of intersection in a family of life lines pertinent to different failure criteria; and (3) the theoretical background and development of David´s theory. The author´s discusses the commenters points further.<>
  • Keywords
    ageing; failure analysis; Arrhenius parameters; David´s theory; degradation; electrotechnical aging compensation effect; failure criteria; intersection; life lines; Aging; Cables; Equations; Insulation; Kinetic theory; Paramagnetic resonance; Proposals; Reliability theory; Solids; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.16534
  • Filename
    16534