DocumentCode
1019987
Title
Comments, with reply, on "Correlation of Arrhenius parameters: the electrotechnical aging compensation effect
Author
Montanari, Gian
Author_Institution
Inst. d´Electrotech. Ind., Bologna Univ., Italy
Volume
23
Issue
6
fYear
1988
Firstpage
1057
Lastpage
1063
Abstract
The commenter makes three particular comments concerning the work of P.K. David (see ibid., vol. 22, p.229-236, 1987). They relate to: (1) the question of whether different properties should be related to aging process in different ways, so that degradation of one property is not as sensitive to aging reactions as for another property; (2) the problem of the common point of intersection in a family of life lines pertinent to different failure criteria; and (3) the theoretical background and development of David´s theory. The author´s discusses the commenters points further.<>
Keywords
ageing; failure analysis; Arrhenius parameters; David´s theory; degradation; electrotechnical aging compensation effect; failure criteria; intersection; life lines; Aging; Cables; Equations; Insulation; Kinetic theory; Paramagnetic resonance; Proposals; Reliability theory; Solids; Temperature;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/14.16534
Filename
16534
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