Reliability of Active-Matrix Organic Light-Emitting-Diode Arrays With Amorphous Silicon Thin-Film Transistor Backplanes on Clear Plastic

Author

Hekmatshoar, Bahman ; Kattamis, Alex Z. ; Cherenack, Kunigunde H. ; Long, Ke ; Chen, Jian-Zhang ; Wagner, Sigurd ; Sturm, James C. ; Rajan, Kamala ; Hack, Michael

Author_Institution

Princeton Univ., Princeton

Volume

29

Issue

1

fYear

2008

Firstpage

63

Lastpage

66

Abstract

We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 degC using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of the light emission over time.

Keywords

amorphous semiconductors; elemental semiconductors; light emitting diodes; optical arrays; semiconductor device reliability; silicon; thin film transistors; AMOLED reliability; Si; active-matrix organic light-emitting-diode arrays; amorphous silicon thin-film transistor; bottom-emission devices; clear plastic; plastic substrate; temperature 285 degC; Active matrix organic light emitting diodes; Active matrix technology; Amorphous silicon; Backplanes; Optical arrays; Organic light emitting diodes; Plastics; Substrates; Temperature; Thin film transistors; Active matrix; active-matrix organic light-emitting-diode (AMOLED) display; amorphous silicon; clear plastic; stability; thin-film transistor;

fLanguage

English

Journal_Title

Electron Device Letters, IEEE

Publisher

ieee

ISSN

0741-3106

Type

jour

DOI

10.1109/LED.2007.910800

Filename

4408730