• DocumentCode
    1020481
  • Title

    Analytical Modeling of the Suspended-Gate FET and Design Insights for Low-Power Logic

  • Author

    Akarvardar, Kerem ; Eggimann, Christoph ; Tsamados, Dimitrios ; Chauhan, Yogesh Singh ; Wan, Gordon C. ; Ionescu, Adrian Mihai ; Howe, Roger T. ; Wong, H. S Philip

  • Author_Institution
    Stanford Univ., Stanford
  • Volume
    55
  • Issue
    1
  • fYear
    2008
  • Firstpage
    48
  • Lastpage
    59
  • Abstract
    An analytical model for the suspended-gate field-effect transistor (SGFET), dedicated to the dc analysis of SGFET logic circuits, is developed. The model is based on the depletion approximation and expresses the pull-in voltage, the pull-out voltage, and the stable travel range as a function of the structural parameters. Gate position is explicitly expressed as a function of the gate voltage, thus enabling the convenient integration of the analytical SGFET relationships into the standard MOSFET models. Starting from the new SGFET model, the influence of the mechanical hysteresis on the circuit steady-state behavior is discussed, the potential of using the SGFET as an ultra-low power switch is demonstrated, and the operation of the complementary SGFET inverter is analyzed.
  • Keywords
    field effect logic circuits; field effect transistors; semiconductor device models; MOSFET models; SGFET logic circuits; analytical model; circuit steady-state behavior; depletion approximation; logic circuits; low-power logic; mechanical hysteresis; pull-in voltage; pull-out voltage; structural parameters; suspended-gate FET; suspended-gate field-effect transistor; ultra-low power switch; Analytical models; FETs; Hysteresis; Inverters; Logic circuits; Logic design; MOSFET circuits; Steady-state; Structural engineering; Voltage; Electrostatic actuators; MOSFET; inverter; microelectromechanical system (MEMS); nanoelectromechanical field-effect transistor (NEMFET); nanoelectromechanical systems (NEMS); resonant-gate FET; subthreshold swing; suspended-gate FET (SGFET);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.911070
  • Filename
    4408768