DocumentCode
1020503
Title
Calculation of the SEM parameters from the transient response of a thin wire
Author
Cho, Kun ; Cordaro, Jennifer
Author_Institution
Univ. of New Mexico, Albuquerque, NM, USA
Volume
28
Issue
6
fYear
1980
fDate
11/1/1980 12:00:00 AM
Firstpage
921
Lastpage
924
Abstract
The problem of determining the singularity expansion method (SEM) parameters from transient thin-wire data is examined. A computer code is used to generate response data. The SEM parameters are computed from these data. For noisy data, it is shown that the parameter values can be improved by averaging.
Keywords
Electromagnetic transient scattering; Singularity expansion methods; Transient electromagnetic scattering; Wire scatterers; EMP radiation effects; Electromagnetic measurements; Electromagnetic scattering; Electromagnetic transients; Frequency; Laplace equations; Pulse measurements; Scattering parameters; Transient response; Wire;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/TAP.1980.1142409
Filename
1142409
Link To Document