Title :
Calculation of the SEM parameters from the transient response of a thin wire
Author :
Cho, Kun ; Cordaro, Jennifer
Author_Institution :
Univ. of New Mexico, Albuquerque, NM, USA
fDate :
11/1/1980 12:00:00 AM
Abstract :
The problem of determining the singularity expansion method (SEM) parameters from transient thin-wire data is examined. A computer code is used to generate response data. The SEM parameters are computed from these data. For noisy data, it is shown that the parameter values can be improved by averaging.
Keywords :
Electromagnetic transient scattering; Singularity expansion methods; Transient electromagnetic scattering; Wire scatterers; EMP radiation effects; Electromagnetic measurements; Electromagnetic scattering; Electromagnetic transients; Frequency; Laplace equations; Pulse measurements; Scattering parameters; Transient response; Wire;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.1980.1142409
