• DocumentCode
    1020546
  • Title

    Progressive Development of Superjunction Power MOSFET Devices

  • Author

    Chen, Yu ; Liang, Yung C. ; Samudra, Ganesh S. ; Yang, Xin ; Buddharaju, Kavitha D. ; Feng, Hanhua

  • Author_Institution
    Nat. Univ. of Singapore, Singapore
  • Volume
    55
  • Issue
    1
  • fYear
    2008
  • Firstpage
    211
  • Lastpage
    219
  • Abstract
    The originally proposed superjunction (SJ) power MOSFET structure with interdigitated p-n columns is highly recognized for its higher voltage-blocking capability and lower specific on -state resistance. However, in practice, the performance of SJ devices is greatly handicapped due to difficulties in the formation of perfect charge-balanced p-n columns by the limitation of fabrication process technology, particularly, for devices with small p-n column widths at low voltage ratings. Recently developed structures of polysilicon-flanked and oxide-bypassed SJ MOSFETs are to overcome the conventional SJ device fabrication limitation. The follow-up development on extending the scope of these recently reported device structures to lateral SJ structures, which is suitable for SJ power integrated circuits, is reported for the first time. In this paper, detailed descriptions of the progressive development and the technical advancement of several SJ MOSFET structures are presented with both simulation and experimental results.
  • Keywords
    power MOSFET; power integrated circuits; superjunction power MOSFET devices; voltage-blocking capability; Circuit simulation; Doping; Epitaxial growth; Etching; Fabrication; Low voltage; MOSFET circuits; Power MOSFET; Power integrated circuits; Silicon; Power integrated circuits; power MOSFET; silicon unipolar limit; superjuction (SJ);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.911344
  • Filename
    4408774