DocumentCode
1020734
Title
2-D Analytical Model for Current–Voltage Characteristics and Transconductance of AlGaN/GaN MODFETs
Author
Li, Miao ; Wang, Yan
Author_Institution
Tsinghua Univ., Beijing
Volume
55
Issue
1
fYear
2008
Firstpage
261
Lastpage
267
Abstract
A threshold-voltage-based 2-D analytical model for the current-voltage characteristics of the AlGaN/GaN modulation-doped field-effect transistors (MODFETs) is presented. In this paper, the conventional charge-control model is improved by employing the Robin boundary condition when solving the 1-D Schrodinger equation in the low longitudinal-field region and introducing an adjustable eigenvalue during the solution of the 2-D Poisson´s equation in the velocity-saturation region. A modified Polyakov-Schwierz mobility model, as well s a low-field mobility model, has been developed. In addition, the nonlinear polarization effects at the AlGaN/GaN interface and the parasitic source/drain resistances are incorporated. Our model predicts the drain current of a second-order continuity, and both the transconductance and output conductance can be determined analytically. We validate the model with experimental data for and MODFETs, respectively, and obtained good agreements.
Keywords
Poisson equation; Schrodinger equation; carrier mobility; eigenvalues and eigenfunctions; high electron mobility transistors; semiconductor device models; 1D Schrodinger equation; 2D Poisson equation; 2D analytical model; AlGaN-GaN; MODFET; Robin boundary condition; adjustable eigenvalue; current-voltage characteristics; drain current; improved charge-control model; low-field mobility model; modified Polyakov-Schwierz mobility model; modulation-doped field-effect transistors; nonlinear polarization effects; parasitic source/drain resistances; second-order continuity; transconductance property; velocity-saturation region; Aluminum gallium nitride; Analytical models; Boundary conditions; Current-voltage characteristics; Epitaxial layers; FETs; Gallium nitride; HEMTs; MODFETs; Transconductance; AlGaN/GaN; MODFETs; compact model; sheet carrier concentration;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2007.911076
Filename
4408791
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