• DocumentCode
    1020734
  • Title

    2-D Analytical Model for Current–Voltage Characteristics and Transconductance of AlGaN/GaN MODFETs

  • Author

    Li, Miao ; Wang, Yan

  • Author_Institution
    Tsinghua Univ., Beijing
  • Volume
    55
  • Issue
    1
  • fYear
    2008
  • Firstpage
    261
  • Lastpage
    267
  • Abstract
    A threshold-voltage-based 2-D analytical model for the current-voltage characteristics of the AlGaN/GaN modulation-doped field-effect transistors (MODFETs) is presented. In this paper, the conventional charge-control model is improved by employing the Robin boundary condition when solving the 1-D Schrodinger equation in the low longitudinal-field region and introducing an adjustable eigenvalue during the solution of the 2-D Poisson´s equation in the velocity-saturation region. A modified Polyakov-Schwierz mobility model, as well s a low-field mobility model, has been developed. In addition, the nonlinear polarization effects at the AlGaN/GaN interface and the parasitic source/drain resistances are incorporated. Our model predicts the drain current of a second-order continuity, and both the transconductance and output conductance can be determined analytically. We validate the model with experimental data for and MODFETs, respectively, and obtained good agreements.
  • Keywords
    Poisson equation; Schrodinger equation; carrier mobility; eigenvalues and eigenfunctions; high electron mobility transistors; semiconductor device models; 1D Schrodinger equation; 2D Poisson equation; 2D analytical model; AlGaN-GaN; MODFET; Robin boundary condition; adjustable eigenvalue; current-voltage characteristics; drain current; improved charge-control model; low-field mobility model; modified Polyakov-Schwierz mobility model; modulation-doped field-effect transistors; nonlinear polarization effects; parasitic source/drain resistances; second-order continuity; transconductance property; velocity-saturation region; Aluminum gallium nitride; Analytical models; Boundary conditions; Current-voltage characteristics; Epitaxial layers; FETs; Gallium nitride; HEMTs; MODFETs; Transconductance; AlGaN/GaN; MODFETs; compact model; sheet carrier concentration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.911076
  • Filename
    4408791