DocumentCode :
1020893
Title :
Modeling the Centroid and the Inversion Charge in Cylindrical Surrounding Gate MOSFETs, Including Quantum Effects
Author :
Roldán, J.B. ; Godoy, Andrés ; Gámiz, Francisco ; Balaguer, M.
Author_Institution :
Univ. de Granada, Granada
Volume :
55
Issue :
1
fYear :
2008
Firstpage :
411
Lastpage :
416
Abstract :
A semiempirical model was developed for calculating the inversion charge of cylindrical surrounding gate transistors (SGTs), including quantum effects. To achieve this goal, we used a simulator that self-consistently solves the 2-D Poisson and Schrodinger equations in a cross section of the SGT. By means of the proposed models, we correctly reproduced the simulation data for a wide range of the device radius and gate voltage values. Both the inversion charge and the centroid models consist of simple mathematical equations within an explicit calculation scheme suitable for use in circuit simulators.
Keywords :
MOSFET; Poisson equation; Schrodinger equation; quantum theory; semiconductor device models; 2-D Poisson equations; MOSFET; Schrodinger equations; centroid models; cylindrical-surrounding gate transistors; inversion charge; quantum effects; semiempirical model; Circuit simulation; Degradation; Helium; Impurities; MOSFETs; Mathematical model; Poisson equations; Schrodinger equation; Silicon on insulator technology; Threshold voltage; Gate all around MOSFET (GAA MOSFET); inversion charge centroid; inversion charge model; inversion charge modelling including quantum effects; silicon-on-insulator (SOI); surrounding gate transistor (SGT);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.911096
Filename :
4408807
Link To Document :
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