Title :
Depth profiling of modulation noise
Author :
Coutellier, Jean-Marc ; Bertram, H. Neal
Author_Institution :
Enertec-Schlumberger, Velizy, France
fDate :
1/1/1987 12:00:00 AM
Abstract :
Tape modulation noise mechanisms were studied by measuring the noise power flux versus the magnetized depth. A dc current was applied to a small gap head to magnetize the tape. For wavelengths from 40 to 4 μm, current instrumentation tapes and a commercial video tape showed predominantly surface noise. Noise mechanisms will be discussed, including cross-correlation measurements of ac erased and dc saturated noises.
Keywords :
Magnetic recording noise; Measurement noise; Noise measurement; Instruments; Magnetic flux; Magnetic heads; Magnetic modulators; Magnetic noise; Noise measurement; Rough surfaces; Saturation magnetization; Surface roughness; Wavelength measurement;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1064745
