A strongly code disjoint built-in current sensor for strongly fault-secure static CMOS realizations

Author

Lo, Jien-Chung ; Daly, James C. ; Nicolaidis, Michael

Author_Institution

Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA

Volume

14

Issue

11

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

1402

Lastpage

1407

Abstract

We present a strongly code disjoint (SCD) built-in current sensor (BICS) based on self-exercising concept. The integration of this SCD BICS with a self-checking circuit achieves the totally self-checking goal in static CMOS realizations, even in the presence of stuck-on and bridging faults, and results in a strongly fault-secure realization. Low-cost and high fault coverage is attractive for many high reliability and critical applications

Keywords

CMOS logic circuits; built-in self test; electric current measurement; electric sensing devices; integrated circuit testing; logic testing; bridging faults; built-in current sensor; self-checking circuit; self-exercising concept; static CMOS realizations; strongly code disjoint sensor; strongly fault-secure realizations; stuck-on faults; totally self-checking scheme; Algorithm design and analysis; Circuit faults; Circuit testing; Computer science; Design automation; Parallel processing; Processor scheduling; Reduced instruction set computing; Scheduling algorithm; Very large scale integration;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.469665

Filename

469665