Title :
Low-frequency recombination-generation noise in Silicon FET´s
Author :
Lauritzen, P.O. ; Sah, C.T.
fDate :
9/1/1963 12:00:00 AM
Keywords :
FETs; Fluctuations; Gold; Laser modes; Laser noise; Low-frequency noise; Noise level; Semiconductor device noise; Silicon; Surface emitting lasers;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1963.15222
