Title :
Review of experimental evidence supporting the Shockley model in epitaxial p-n heterojunctions
Author :
Perlman, S.S. ; Williams, Rebecca M.
fDate :
9/1/1963 12:00:00 AM
Keywords :
Conductors; Electrodes; Energy states; Fabrication; Heterojunctions; Insulation; Low-frequency noise; Semiconductor process modeling; Thin film transistors; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1963.15226
