• DocumentCode
    1021360
  • Title

    SAW oscillator frequency stability at high temperatures

  • Author

    Sinha, Bikash K. ; Groves, Joel L. ; Sudo, Yukio ; Sat, Shigeru

  • Author_Institution
    Shlumberger-Doll Res., Ridgefield, CT, USA
  • Volume
    37
  • Issue
    2
  • fYear
    1990
  • fDate
    3/1/1990 12:00:00 AM
  • Firstpage
    85
  • Lastpage
    98
  • Abstract
    A broad overview of various factors affecting the frequency stability of surface-acoustic-wave (SAW) resonators is given. Two major causes of rapid degradation in the long-term frequency stability are the presence of a chromium interface between aluminum and quartz, and moderate to high drive levels in SAW devices with pure aluminum fingers, resulting in metal migration in the region of high thin-film stresses. On the other hand, devices with copper-doped aluminum electrodes maintained excellent long-term stability, even when operating at 175 degrees C and at moderately high drive levels. Experimental data on both the long-term and short-term frequency stabilities of SAW devices at 25 degrees C and 175 degrees C for moderate to high drive levels are presented. Results obtained for the frequency stabilities of SAW devices with pure aluminum and copper-doped aluminum electrodes are compared. It is shown that the short-term frequency stability of SAW devices with copper-doped aluminum electrodes is a few parts in 10/sup 10/, even at 175 degrees C and for moderately large drive levels. Overall, the best short-term frequency stability is found to be for a gate time of 0.1 s.<>
  • Keywords
    aluminium; aluminium alloys; copper alloys; crystal resonators; failure analysis; frequency stability; oscillators; quartz; surface acoustic wave devices; 175 C; 25 C; Al-Cr-SiO/sub 2/; Al-SiO/sub 2/; Al:Cu-SiO/sub 2/; IDT fingers; SAW oscillator frequency stability; SAW oscillators; SAW resonators; causes of rapid degradation; elevated temperatures; factors affecting the frequency stability; high drive levels; high film stresses; high temperatures; long-term frequency stability; long-term stability; metal migration; overview; short-term frequency stabilities; Aluminum; Chromium; Degradation; Electrodes; Frequency; Oscillators; Stability; Surface acoustic wave devices; Surface acoustic waves; Temperature;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.46973
  • Filename
    46973