Title :
The effect of impurity diffusion and drift on the peak current density of germanium tunnel diodes
Author :
Hulme, K.F. ; Morgan, James R
fDate :
9/1/1963 12:00:00 AM
Keywords :
Conductors; Current density; Diodes; Germanium; Impurities; Laboratories; Microphones; Optical devices; Stress; Telephony;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1963.15252
