DocumentCode
1021714
Title
A new method of measuring noise parameters S and π of an electron beam
Author
Okoshi, Tadashi
Volume
11
Issue
1
fYear
1964
fDate
1/1/1964 12:00:00 AM
Firstpage
37
Lastpage
38
Keywords
Circuits; Electron beams; Noise measurement; Particle beam measurements; Particle beams; Phase noise; Plasma measurements; Plasma waves; Radiometry; Wavelength measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1964.15276
Filename
1473664
Link To Document