Title :
A new method of measuring noise parameters S and π of an electron beam
fDate :
1/1/1964 12:00:00 AM
Keywords :
Circuits; Electron beams; Noise measurement; Particle beam measurements; Particle beams; Phase noise; Plasma measurements; Plasma waves; Radiometry; Wavelength measurement;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1964.15276
