Title :
Complex permittivity measurement of optoelectronic substrates
Author :
Bourreau, D. ; Guillon, P. ; Chatard-Moulin, M.
Author_Institution :
UER des Sciences, LCOM, UA CNRS 356, Limoges, France
Abstract :
We propose and analyse new techniques to measure both transverse and longitudinal dielectric constants and the loss tangent of anisotropic dielectric samples usually used in integrated optics such as LiNbO3
Keywords :
dielectric loss measurement; integrated optics; permittivity measurement; LiNbO3; anisotropic dielectric samples; complex permittivity measurement; integrated optics; longitudinal dielectric constants; loss tangent; optoelectronic substrates; transverse dielectric constant;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860271
