DocumentCode :
1022263
Title :
Transient response characteristics in identification and imaging
Author :
Moffat, David L. ; Young, Jonathan D. ; Ksienski, Aharon A. ; Lin, Heng-cheng ; Rhoads, Charles M.
Author_Institution :
Ohio State Univ., Columbus, OH, USA
Volume :
29
Issue :
2
fYear :
1981
fDate :
3/1/1981 12:00:00 AM
Firstpage :
192
Lastpage :
205
Abstract :
Three different solutions to problems in identification and inverse scattering using restricted far-zone scattering data are reviewed and illustrated. The data are restricted in the sense that the frequencies, aspects, and polarizations are limited. All three solutions are based in part on a fundamental time domain viewpoint whereby the far-zone scattering characteristics of any finite object are uniquely summarized by its impulse response waveforms. Insight provided by these waveforms is exploited via geometrical characteristics extracted from steady-state, forced, and free responses of the object. For the present purposes the fundamental importance of signaling waveforms whose wavelengths are within an order of magnitude of the object dimension is demonstrated. The basic methods discussed have been previously identified in the literature as natural resonance estimation, radar imaging from ramp response signatures, and low frequency classification. Related common features, additional insight, and some new results are given. Applications of all three methods to objects ranging from simple to complex geometries are described.
Keywords :
Electromagnetic scattering, inverse problem; Electromagnetic transient scattering; Radar imaging/mapping; Transient electromagnetic scattering; Electromagnetic scattering; Frequency estimation; Inverse problems; Light scattering; Polarization; Radar scattering; Shape measurement; Transient response; Transmitters; Vectors;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.1981.1142584
Filename :
1142584
Link To Document :
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