DocumentCode :
1022367
Title :
A physically based small-signal circuit model for heterostructure acoustic charge transport devices
Author :
Kenney, J. Stevenson ; Hunt, William D.
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
41
Issue :
12
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
2218
Lastpage :
2226
Abstract :
A physically based small-signal circuit model for GaAs-AlGaAs Schottky gate heterostructure acoustic charge transport (HACT) devices is presented. Analytical expressions for the instantaneous and average channel current as a function of gate voltage are obtained from physical device parameters. The charge injection model is based on subthreshold current models for GaAs MESFETs. It is shown that the shape of the sampling aperture of the charge injection operation is approximately Gaussian. Good agreement is obtained between the measured DC channel current versus gate voltage and that predicted by the model. Equivalent circuits for the transfer and output sensing operations and expressions for noise sources due to the physical processes that occur within the device are developed. Thermal, shot, and transfer noise are treated. The form of the analytic expressions for frequency response and noise figure allows easy implementation on commercially available CAE software. Simulations of both gain and noise figure performed on Libra show good agreement with measured data
Keywords :
III-V semiconductors; Schottky effect; acoustic charge transport devices; aluminium compounds; equivalent circuits; frequency response; gallium arsenide; random noise; semiconductor device models; semiconductor device noise; thermal noise; CAE software; GaAs-AlGaAs; Libra; Schottky gate heterostructure ACT; acoustic charge transport devices; channel current; charge injection model; equivalent circuits; frequency response; gate voltage; noise figure; noise sources; physically based model; sampling aperture; shot noise; small-signal circuit model; subthreshold current models; thermal noise; transfer noise; Acoustic devices; Apertures; Circuit noise; Gallium arsenide; MESFETs; Noise figure; Sampling methods; Shape; Subthreshold current; Voltage;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.260709
Filename :
260709
Link To Document :
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