DocumentCode
1022415
Title
IEEE standard test procedure for semiconductor diodes
Volume
11
Issue
8
fYear
1964
fDate
8/1/1964 12:00:00 AM
Firstpage
398
Lastpage
402
Keywords
Breakdown voltage; Circuit testing; Current measurement; Electric resistance; Electrical resistance measurement; Measurement standards; Pulse measurements; Reproducibility of results; Semiconductor device testing; Semiconductor diodes;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1964.15348
Filename
1473736
Link To Document