Title :
Thermal noise in Hall-effect twoports
fDate :
9/1/1964 12:00:00 AM
Keywords :
Attenuators; Electrons; Frequency; Hall effect; Impedance; Measurement standards; Noise figure; Noise measurement; Reflection; Testing;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1964.15357
