Title :
Thermal Rating of Overhead Line Wire
Author_Institution :
The Detroit Edison Company; Jam Handy Organization, Detroit, Mich.
fDate :
7/1/1943 12:00:00 AM
Keywords :
Annealing; Conducting materials; Copper; Frequency; Heating; Impurities; Silver; Temperature; Testing; Wire;
Journal_Title :
American Institute of Electrical Engineers, Transactions of the
DOI :
10.1109/T-AIEE.1943.5058730
