• DocumentCode
    1022543
  • Title

    Capacitive design considerations for film-type and integrated circuits

  • Author

    Compton, J.B. ; Happ, W.W

  • Author_Institution
    Motorola, Inc., Scottsdale, Ariz.
  • Volume
    11
  • Issue
    10
  • fYear
    1964
  • fDate
    10/1/1964 12:00:00 AM
  • Firstpage
    447
  • Lastpage
    455
  • Abstract
    A critical survey of capacitive effects in thin-film structures was made and design parameters to assess interelectrode coupling in integrated circuits were determined. By applying judiciously conformal mapping techniques, procedures and graphs were developed which permit evaluation of interfilm capacitances for many types of plane-parallel and cylindrical geometries. Representative designs of integrated circuits were analysed to demonstrate the effectiveness of these techniques.
  • Keywords
    Circuit synthesis; Conformal mapping; Coupling circuits; Dielectric constant; Dielectric losses; Dielectric materials; Geometry; Oscillators; Parasitic capacitance; Thin film circuits;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1964.15363
  • Filename
    1473751
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1022543