• DocumentCode
    1022560
  • Title

    An analysis of the CdSe thin-film triode as a current limiter

  • Author

    Gutierrez, William A. ; Wilson, Herbert L.

  • Author_Institution
    Melpar Inc., Falls Church, Va.
  • Volume
    11
  • Issue
    10
  • fYear
    1964
  • fDate
    10/1/1964 12:00:00 AM
  • Firstpage
    466
  • Lastpage
    470
  • Abstract
    An analysis of the insulated-gate thin-film field-effect triode as a current limiter is presented, and a comparison between theory and experiment is made for samples with cadmium selenide as the semiconductor layer. The theoretical treatment involves the extension of the analysis of p-n junction type current limiters to the thin-film, insulated-gate, field-effect device. Although the insulated-gate devices are operable in either enhancement or depletion modes, the analysis applies only to depletion mode operation. Good correlation between predicted and experimental values is found. This provides strong evidence that depletion mode operation of the device involves the modulation of semiconductor conductivity through a field induced variation of the depth of the space charge region. The characteristics of vacuum deposited cadmium selenide current limiters are also described.
  • Keywords
    Cadmium compounds; Current limiters; Electrodes; Insulation; P-n junctions; Semiconductor thin films; Temperature; Thin film devices; Transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1964.15365
  • Filename
    1473753