Title :
RF surface resistance of Nb3Sn, NbZr, and NbN thin films
Author :
Allen, L.H. ; Beasley, M.R. ; Hammond, R.H. ; Turneaure, J.P.
Author_Institution :
Stanford University, Stanford, CA
fDate :
3/1/1987 12:00:00 AM
Abstract :
The surface resistance of Nb3Sn films prepared by electron-beam co-deposition and magnetron sputtering has been measured at 8.6 GHz and from 1.5 K through Tc. We find that carefully controlled deposition temperatures of ≈900 C are necessary to obtain the lowest-loss materials. In both evaporated and sputtered samples with stoichiometric composition (Tc= 17.8 K), we see sharp transitions. In off-stoichiometric samples, however, the transition is lower and wider, yielding excessive losses. The residual losses, normal-state surface resistance, and the reduced gap values we obtain for our Nb3Sn samples are also discussed. The surface resistance of a NbZr alloy film and a NbN sample obtained from Hypres, Inc. are also reported.
Keywords :
Resistance measurements; Superconducting films; Surfaces; Electrical resistance measurement; Niobium; Niobium-tin; Radio frequency; Substrates; Superconducting films; Superconductivity; Surface resistance; Temperature; Tin;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1064870