DocumentCode
1022580
Title
As- and Ga-implanted silicon camel diodes
Author
Vescan, L. ; Splettst¿¿¿?er, J. ; Beneking, H.
Author_Institution
Technical University of Aachen, Institute of Semiconductor Electronics, Aachen, West Germany
Volume
22
Issue
9
fYear
1986
Firstpage
493
Lastpage
494
Abstract
The fabrication of Si-camel diodes using low-energy implantation of As and Ga into preamorphised substrates is described. By changing the Ga ion energy between 24 and 33 keV, it was possible to vary the barrier height of the diodes in the range 0.33 eV to 0.63 eV.
Keywords
arsenic; elemental semiconductors; gallium; ion implantation; semiconductor diodes; semiconductor doping; 0.33 eV to 0.63 eV; 24 to 33 keV; As; Ga ion energy; Si; Si:Ga,As; barrier height; camel diodes; elemental semiconductor; fabrication; low-energy implantation; preamorphised substrates;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19860335
Filename
4256529
Link To Document