Optimization of electrooptic sampling by volume-integral method

Author

Thomann, W. ; Rottenkolber, M. ; Russer, P.

Author_Institution

Inst. fur Hochfrequenztech., Tech. Univ. Munchen, Germany

Volume

41

Issue

12

fYear

1993

fDate

12/1/1993 12:00:00 AM

Firstpage

2392

Lastpage

2399

Abstract

A rigorous treatment of the influence of an inhomogeneous electric field on the differential polarization of an optical field and the corresponding change in transmission of retarder setup is presented. The method yields sensitivity coefficients employed directly in a volume integral. In the case of an external electrooptic probe tip a layered structure with a space-harmonic potential and a Gaussian sampling beam is investigated, and results on sensitivity and spatial resolution are presented. The probing of inhomogeneous longitudinal and transverse fields with the same setup is demonstrated for a microstrip transmission line

Keywords

electro-optical devices; integrated circuit testing; microwave integrated circuits; probes; Gaussian sampling beam; differential polarization; electrooptic sampling; external electrooptic probe tip; inhomogeneous electric field; longitudinal fields; microstrip transmission line; optical field; retarder setup; sensitivity coefficients; space-harmonic potential; spatial resolution; transverse fields; volume-integral method; Microstrip; Nonuniform electric fields; Optical polarization; Optical retarders; Optical sensors; Optimization methods; Probes; Sampling methods; Spatial resolution; Transmission lines;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.260733

Filename

260733