Title :
Grown-film silicon transistors on sapphire
Author :
Mueller, C.W. ; Robinson, P.H.
fDate :
11/1/1964 12:00:00 AM
Keywords :
Capacitance; Charge carrier lifetime; Frequency response; Laboratories; MOS devices; Silicon;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1964.15383
