Title :
The attenuation length of hot electrons in gold
Author :
Soshea, R.W. ; Lucas, R.C.
fDate :
11/1/1964 12:00:00 AM
Keywords :
Attenuation; Capacitance; Charge carrier lifetime; Electrons; Frequency response; Gold; Laboratories; MOS devices;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1964.15385
