DocumentCode :
1022784
Title :
Assessment of dielectric degradation by ultrawide-band PD detection
Author :
Morshuis, Peter
Author_Institution :
High Voltage Lab., Delft Univ. of Technol., Netherlands
Volume :
2
Issue :
5
fYear :
1995
fDate :
10/1/1995 12:00:00 AM
Firstpage :
744
Lastpage :
760
Abstract :
Partial discharges (PD) and the way they affect insulation quality has for decades been a rewarding subject for many researchers. There are two topics that are of particular interest to the workers in the field of PD. One is the impact of a wide variety of statistical tools on the interpretation of discharge data obtained with standard PD detection apparatus according to IEC270. The other topic is the study of discharge-induced degradation processes by looking into the physics of the discharge process. This can be done by different means but a valuable technique, at least for the laboratory, is the use of ultra-wide band PD detection systems. This paper is a mix of a short review on the progression in the understanding of deterioration by internal PD obtained with such systems and of results recently obtained by the author
Keywords :
ageing; charge measurement; insulation testing; partial discharges; aging; dielectric degradation; discharge pulse shape; discharge-induced degradation processes; fast filamentary discharge; insulation quality; internal PD; partial discharges; slow discharge pulse; ultrawide-band PD detection; Bandwidth; Cameras; Degradation; Dielectrics and electrical insulation; Oscilloscopes; Partial discharges; Physics; Pulse measurements; Velocity measurement; Voltage;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/94.469971
Filename :
469971
Link To Document :
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