DocumentCode
1022825
Title
High-frequency capacitance measurements on MOS structures and devices
Author
Szedon, J.R.
Volume
11
Issue
11
fYear
1964
fDate
11/1/1964 12:00:00 AM
Firstpage
531
Lastpage
531
Keywords
Capacitance measurement; Chemicals; Conducting materials; Insulation; Reproducibility of results; Research and development; Silicon; Snow; Surface treatment; Thermal conductivity;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1964.15390
Filename
1473778
Link To Document