Title :
High-frequency capacitance measurements on MOS structures and devices
fDate :
11/1/1964 12:00:00 AM
Keywords :
Capacitance measurement; Chemicals; Conducting materials; Insulation; Reproducibility of results; Research and development; Silicon; Snow; Surface treatment; Thermal conductivity;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1964.15390
