DocumentCode :
1022841
Title :
Characterization of vanadium diffusion barriers in Nb-Sn composite wires
Author :
Smathers, D.B. ; O´Laray, P. ; Shiddall, M. ; Peterson, J.R. ; McDonal, K.
Author_Institution :
Teledyne Wah Chang Albany, Albany, OR
Volume :
23
Issue :
2
fYear :
1987
fDate :
3/1/1987 12:00:00 AM
Firstpage :
1347
Lastpage :
1350
Abstract :
Ductile vanadium has been explored for use as a diffusion barrier material in niobium-tin composite wires. Vanadium is found to co-process well, standing over 99.995% area reduction without anneal. Resistance ratios greater than 300 to 1 (0°c to 20K) have been measured in reacted composite wire with noncopper current densities greater than 1700 A/mm2at 10 Tesla, 4.2K. Vanadium forms an intermetallic compound on the tin side which should not be superconducting above 4.2K. The composite residual resistance ratio (RRR) is seen to be dependent on reaction conditions being higher as the reaction temperature is dropped. To determine the source of this effect a copper-vanadium composite was fabricated. Features similar to the superconducting wire were observed. There is a reasonable overlap of reaction conditions suitable for both the superconductor and the copper making high RRR possible for optimized conductors.
Keywords :
Superconducting filaments/wires; Vanadium materials/devices; Annealing; Composite materials; Current density; Current measurement; Density measurement; Electrical resistance measurement; Intermetallic; Niobium-tin; Superconducting filaments and wires; Tin;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1987.1064896
Filename :
1064896
Link To Document :
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