DocumentCode

1022979

Title

Influence of traps on diodes

Author

Lubart, N.D. ; Hegedus, C.L.

Volume

11

Issue

11

fYear

1964

fDate

11/1/1964 12:00:00 AM

Firstpage

533

Lastpage

533

Keywords

Capacitance; Diodes; Doping; Gold; P-n junctions; Silicon carbide; Solid modeling; Solid state circuits; Temperature; Voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1964.15406

Filename

1473794