DocumentCode :
1022986
Title :
Effect of deep traps on capacitance, current, and light output of junctions
Author :
Morgan, T.N.
Volume :
11
Issue :
11
fYear :
1964
fDate :
11/1/1964 12:00:00 AM
Firstpage :
533
Lastpage :
533
Keywords :
Capacitance; Capacitors; Doping; Gold; P-i-n diodes; P-n junctions; Semiconductor diodes; Silicon; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1964.15407
Filename :
1473795
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1022986
