DocumentCode

1023079

Title

Noise measurements at microwave frequencies in an InSb photoconductive optical detector

Author

Fuls, E.N.

Volume

11

Issue

11

fYear

1964

fDate

11/1/1964 12:00:00 AM

Firstpage

535

Lastpage

535

Keywords

FETs; Insulation; Interface states; Microwave frequencies; Noise measurement; Optical detectors; Photoconductivity; Silicon compounds; Tin; Voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1964.15416

Filename

1473804