• DocumentCode
    1023088
  • Title

    Caughey-Thomas parameters for electron mobility calculations in GaAs

  • Author

    Maziar, C.M. ; Lundstrom, M.S.

  • Author_Institution
    Purdue University, School of Electrical Engineering, West Lafayette, USA
  • Volume
    22
  • Issue
    11
  • fYear
    1986
  • Firstpage
    565
  • Lastpage
    566
  • Abstract
    The Caughey-Thomas expression, an empirically derived formulation for carrier mobility, is used here to relate carrier compensation to electron mobility. A set of equations expressing the Caughey-Thomas parameters as functions of the compensation ratio are presented. Use of these expressions reproduces results of theoretical low-field mobility computations and provides a simple means of incorporating effects of carrier compensation as well as concentration in device analysis programs.
  • Keywords
    III-V semiconductors; carrier mobility; gallium arsenide; Caughey-Thomas expression; Caughey-Thomas parameters; GaAs; carrier compensation; carrier concentration; compensation ratio; device analysis programs; electron mobility; electron mobility calculations; empirically derived formulation; semiconductors; theoretical low-field mobility computation;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19860384
  • Filename
    4256580