• DocumentCode
    1023292
  • Title

    Semidistributed model of millimeter-wave FET for parameter and noise figure predictions

  • Author

    Escotte, Laurent ; Mollier, Jean-Claude

  • Author_Institution
    IRCOM, Limoges, France
  • Volume
    38
  • Issue
    6
  • fYear
    1990
  • fDate
    6/1/1990 12:00:00 AM
  • Firstpage
    748
  • Lastpage
    753
  • Abstract
    An electrical FET model, derived from a partition of the actual transistor along its gate width into N identical sections, is presented. This sliced model has two important advantages compared to distributed models: first, the derivation of its element values is obtained by directly applying Kirchhoff´s laws, and second, inserting the noise sources is easy and makes possible the prediction of the FET noise parameters. An example that shows good agreement between minimum noise figures derived from the sliced model and from the Fukui formula in the range 18-40 GHz is given
  • Keywords
    electron device noise; field effect transistors; semiconductor device models; solid-state microwave devices; 18 to 40 GHz; FET noise parameters; Fukui formula; Kirchhoff´s laws; electrical FET model; element values; gate width; millimeter-wave FET; minimum noise figures; noise figure predictions; noise sources; partition; sliced model; Differential equations; Electrodes; FETs; Frequency; MESFETs; Millimeter wave propagation; Millimeter wave transistors; Noise figure; Predictive models; Transmission lines;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.130969
  • Filename
    130969