Title :
Semidistributed model of millimeter-wave FET for parameter and noise figure predictions
Author :
Escotte, Laurent ; Mollier, Jean-Claude
Author_Institution :
IRCOM, Limoges, France
fDate :
6/1/1990 12:00:00 AM
Abstract :
An electrical FET model, derived from a partition of the actual transistor along its gate width into N identical sections, is presented. This sliced model has two important advantages compared to distributed models: first, the derivation of its element values is obtained by directly applying Kirchhoff´s laws, and second, inserting the noise sources is easy and makes possible the prediction of the FET noise parameters. An example that shows good agreement between minimum noise figures derived from the sliced model and from the Fukui formula in the range 18-40 GHz is given
Keywords :
electron device noise; field effect transistors; semiconductor device models; solid-state microwave devices; 18 to 40 GHz; FET noise parameters; Fukui formula; Kirchhoff´s laws; electrical FET model; element values; gate width; millimeter-wave FET; minimum noise figures; noise figure predictions; noise sources; partition; sliced model; Differential equations; Electrodes; FETs; Frequency; MESFETs; Millimeter wave propagation; Millimeter wave transistors; Noise figure; Predictive models; Transmission lines;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on