Title :
Dip testing, effect on life of tube
Author :
Foster, C.P., Jr.
fDate :
5/1/1965 12:00:00 AM
Keywords :
Anodes; Assembly; Cathodes; Coatings; Diodes; Electron tubes; Electronic equipment testing; Life testing; Switches; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1965.15496
