DocumentCode

1023955

Title

IEEE standard on definitions, symbols, and methods of test for semiconductor tunnel (Esaki) diodes and backward diodes

Volume

12

Issue

6

fYear

1965

fDate

6/1/1965 12:00:00 AM

Firstpage

373

Lastpage

386

Keywords

IEEE standards;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1965.15508

Filename

1473972