Title :
Determination of conductivity type from capacitance measurements on MOS diodes
fDate :
6/1/1965 12:00:00 AM
Keywords :
Capacitance measurement; Conducting materials; Conductivity; Frequency; Insertion loss; Microwave technology; Semiconductor diodes; Shape measurement; Silicon; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1965.15512
