مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1024218

Title :

Special Issue on 3D IC Design and Test

Author :

Kung, David ; Xie, Yuan

Author_Institution :

(IBM Research)

Volume :

Issue :

fYear :

2008

Firstpage :

505

Lastpage :

505

Abstract :

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers

fLanguage :

English

Journal_Title :

Design & Test of Computers, IEEE

Publisher :

ieee

ISSN :

0740-7475

Type :

jour

DOI :

10.1109/MDT.2008.168

Filename :

4702871

Link To Document :