• DocumentCode
    1024290
  • Title

    Excess noise in dc SQUIDs from 4.2K to 0.022K

  • Author

    Wellstood, Frederick C. ; Urbina, Cristian ; Clarke, John

  • Author_Institution
    University of California, USA
  • Volume
    23
  • Issue
    2
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    1662
  • Lastpage
    1665
  • Abstract
    Four types of excess noise have been identified in dc SQUIDs operated in the temperature range 0.022 to 4.2 K. At temperatures between about 2 and 4 K, the spectral density of the low frequency flux noise of a wide variety of thin-film dc SQUIDs scales as 1/fmwhere m = 1.0 ± 0.1. In SQUIDs with Nb loops the noise originates as an "apparent flux noise", whereas in those with Pb or PbIn loops the noise is substantially lower and originates in critical current fluctuations. When any of these devices is cooled to temperatures below about 0.5 K, the spectral density of the excess flux noise scales as 1/fm, with m = 0.66 ± 0.08 in most cases, and the noise always originates as an apparent flux noise. At the lowest temperatures, the white noise saturates at an effective temperature of about 150 mK; this excess noise probably arises from self-heating in the resistance shunting each tunnel junction.
  • Keywords
    Josephson device noise; Critical current; Fluctuations; Frequency; Low-frequency noise; Magnetic flux; Magnetic noise; Noise measurement; SQUIDs; Superconducting device noise; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1987.1065021
  • Filename
    1065021