DocumentCode
1024314
Title
Subpicosecond optoelectronic study of superconducting transmission lines
Author
Chi, C.C. ; Gallagher, W.J. ; Duling, I.N. ; Grischkowsky, D. ; Halas, N.J. ; Ketchen, M.B. ; Kleinsasser, A.W.
Author_Institution
IBM T.J. Watson research center, Yorkton Hieghts, NY, USA
Volume
23
Issue
2
fYear
1987
fDate
3/1/1987 12:00:00 AM
Firstpage
1666
Lastpage
1669
Abstract
We have studied the propagation of subpicosecond electrical pulses on coplanar superconducting Nb transmission lines. Pulses with 0.6 ps full width at half maximum were generated by photoconductively shorting a
m region between two charged 1 to 5 μm lines separated by a 2 to 10 μm gap. The propagating pulses were sampled by the delayed shorting of a fast phototconductive switch between a sampling probe and one of the transmission lines at variable distances away from the generation point. Silicon-on-sapphire wafers served as the transmission line substrate, with the 0.5 μm thick Si layer heavily damaged by an oxygen implant to provide the subpicosecond carrier life time for the excitation and probe switches. Measurements and analyses of pulses propagated up to 8 mm distance at temperatures from 2 K to 10 K showed a threshold for strong attenuation and dispersion at a frequency reflecting the onset of pair breaking in the superconducting transmission lines. The results at least qualitatively confirm the superconducting microstrip transmission line calculations of Kautz based on Mattis and Bardeen\´s formulae for the complex conductivity of superconductors.
m region between two charged 1 to 5 μm lines separated by a 2 to 10 μm gap. The propagating pulses were sampled by the delayed shorting of a fast phototconductive switch between a sampling probe and one of the transmission lines at variable distances away from the generation point. Silicon-on-sapphire wafers served as the transmission line substrate, with the 0.5 μm thick Si layer heavily damaged by an oxygen implant to provide the subpicosecond carrier life time for the excitation and probe switches. Measurements and analyses of pulses propagated up to 8 mm distance at temperatures from 2 K to 10 K showed a threshold for strong attenuation and dispersion at a frequency reflecting the onset of pair breaking in the superconducting transmission lines. The results at least qualitatively confirm the superconducting microstrip transmission line calculations of Kautz based on Mattis and Bardeen\´s formulae for the complex conductivity of superconductors.Keywords
Light-triggered switches; Signal sampling/reconstruction; Superconducting transmission lines; Transient propagation; Coplanar transmission lines; Niobium; Photoconductivity; Probes; Propagation delay; Pulse generation; Pulse measurements; Space vector pulse width modulation; Superconducting transmission lines; Switches;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1987.1065024
Filename
1065024
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