• DocumentCode
    1024321
  • Title

    Bivariate mean residual life

  • Author

    Nair, K. R Muralidharan ; Nair, N. Unnikrishnan

  • Author_Institution
    Cochin Univ. of Sci. & Technol., India
  • Volume
    38
  • Issue
    3
  • fYear
    1989
  • fDate
    8/1/1989 12:00:00 AM
  • Firstpage
    362
  • Lastpage
    364
  • Abstract
    An overview is presented of some theoretical results concerning the mean residual life function used in reliability theory. An extension of the concept to the bivariate case is introduced, and the relationship between the reliability and mean residual life function is derived. The properties of the function and conditions for asymptotic exponentiality of component life lengths are discussed
  • Keywords
    life testing; reliability theory; asymptotic exponentiality; bivariate mean residual life; component life lengths; reliability theory; Differential equations; Electric shock; Exponential distribution; Functional analysis; Joining processes; Life testing; Reliability theory; Space technology; Sufficient conditions;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.44183
  • Filename
    44183