Title :
A model for the charge motion and instability in the metal-silicon oxide-silicon structure
fDate :
9/1/1965 12:00:00 AM
Keywords :
Electric variables measurement; Energy measurement; Laboratories; Motion measurement; Oxidation; Pollution measurement; Silicon; Temperature; Voltage; Water pollution;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1965.15555
