• DocumentCode
    1024562
  • Title

    Surface state and surface recombination velocity characteristics of Si-SiO2interfaces

  • Author

    Rosier, L.L.

  • Volume
    12
  • Issue
    9
  • fYear
    1965
  • fDate
    9/1/1965 12:00:00 AM
  • Firstpage
    505
  • Lastpage
    505
  • Keywords
    Charge carrier processes; Electrooptic modulators; Laboratories; Microwave amplifiers; Optical modulation; P-n junctions; Photodetectors; Semiconductor device noise; Semiconductor diodes; Telephony;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1965.15565
  • Filename
    1474029