DocumentCode
1024562
Title
Surface state and surface recombination velocity characteristics of Si-SiO2 interfaces
Author
Rosier, L.L.
Volume
12
Issue
9
fYear
1965
fDate
9/1/1965 12:00:00 AM
Firstpage
505
Lastpage
505
Keywords
Charge carrier processes; Electrooptic modulators; Laboratories; Microwave amplifiers; Optical modulation; P-n junctions; Photodetectors; Semiconductor device noise; Semiconductor diodes; Telephony;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1965.15565
Filename
1474029
Link To Document