Title :
Experimental evidences of the interdependences of the fixed charges, the chargeable surface states and the bulk impurity recombination states in the silicon-oxide silicon structures
Author :
Sah, C.T. ; Collins, D.R.
fDate :
9/1/1965 12:00:00 AM
Keywords :
Charge carrier processes; Impurities; Laboratories; Optical modulation; Semiconductor device noise; Semiconductor diodes; Silicon; Surface treatment; Telephony; Velocity measurement;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1965.15566
